Characterization of the Local Structure and Composition of Low Dimensional Heterostructures and Thin Films
MetadataShow full item record
The observation of graphene’s extraordinary electrical properties has stirred great interest in two dimensional (2D) materials. The rapid pace of discovery for low dimensional materials with exciting properties continue with graphene allotropes, multiple polymorphs of borophene, germanene, and many others. The future of 2D materials goes beyond synthesis and characterization of free standing materials and on to the construction of heterostructures or sophisticated multilayer devices. Knowledge about the resulting local structure and composition of such systems will be key to understanding and optimizing their performance characteristics. 2D materials do not have a repeating crystal structure which can be easily characterized using bulk methods and therefore a localized high resolution method is needed. Electron microscopy is well suited for characterizing 2D materials as a repeating coherent structure is not necessary to produce a measureable signal as may be the case for diffraction methods. A unique opportunity for fine local scale measurements in low dimensional systems exists with a specific class of materials known as ferecrystals, the rotationally disordered relative of misfit layer compounds. Ferecrystals provide an excellent test system to observe effects at heterostructure interfaces as the whole film is composed of interdigitated two dimensional layers. Therefore bulk methods can be used to corroborate local scale measurements. From the qualitative interpretation of high resolution scanning transmission electron microscope (STEM) images to the quantitative application of STEM energy dispersive X-ray spectroscopy (EDX), this thesis uses numerous methods electron microscopy. The culmination of this work is seen at the end of the thesis where atomically resolved STEM-EDX hyperspectral maps could be used to measure element specific atomic distances and the atomically resolved fractional occupancies of a low dimensional alloy. These local scale measurements are corroborated by additional experimental data. The input of multiple techniques leads to improved certainty in local scale measurements and the applicability of these methods to non-ferecrystal low dimensional systems.