EMI test using VXD3 R20 assembly

dc.contributor.authorSinev, Nikolai
dc.date.accessioned2007-08-15T17:39:39Z
dc.date.available2007-08-15T17:39:39Z
dc.date.issued2005-01
dc.format.extent362538 bytes
dc.format.mimetypeapplication/pdf
dc.identifier.citationSinev, N. EMI test using VXD3 R20 assembly. Presented at the MDI Workshop, SLAC, Stanford, CA, Jan. 6-8, 2005.en
dc.identifier.urihttps://hdl.handle.net/1794/4928
dc.language.isoen_USen
dc.titleEMI test using VXD3 R20 assemblyen
dc.typePresentationen

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