Browsing by Subject "Nano Electromechanical Systems (NEMS)"

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Field Emission Based Displacement Sensing Using a Carbon Nanotube Enhanced Electromechanical Probe

Resch, Rudolph (University of Oregon, 2020-09-24)

The simple measurement of a distance has long powered sensitive scientific instruments. In the case of scanning probe microscopy (SPM), instruments like Scanning Tunneling Microsopes (STM) and Atomic Force Microscopes (AFM) ...